| 掲載年度 |
2016 |
| 種類 |
国外
|
| 学会名 |
Pacific Rim Symposium on Surfaces, Coatings & Interfaces (PACSURF 2016) |
| 発表題目 |
Nanoscopic Analysis of Semiconductor Heterointerfaces by Kelvin Probe Force Microscopy (KFM) |
| 発表者 |
Itaru Kamiya
Fumihiko Yamada
Tomohiro Kobayashi（量子界面物性）
Ko Takabayashi（量子界面物性）
Kenichi Shimomura（量子界面物性）
Yuwei Zhang
|
| 主催団体 |
American Vacuum Society |
| 発表場所 |
Hapuna Beach Prince Hotel, Kohala Coast, HI, U.S.A. |
| 発表日 |
2016/12/14
|
| 講演内容 |
Kelvin probe force microscopy has been employed to study the interfaces of Si heterostructure solar cell structures. The depth profile near the electrode-Si interface has been investigated. |
