| 掲載年度 |
2011 |
| 種類 |
国外
|
| 学会名 |
The 28th North American Molecular Beam Epitaxy Conference |
| 発表題目 |
Shallow Defect States in GaAs Responsible for GaAs Bandgap Upconversion Induced by Electron Diffraction Beam During MBE Growth |
| 発表者 |
David M. Tex（量子界面物性）
Itaru Kamiya
|
| 主催団体 |
American Vacuum Society |
| 発表場所 |
University of California San Diego |
| 発表日 |
2011/08/15
|
| 講演内容 |
|
