学会発表

表面科学
PD研究員 カニシカ デ シルバ

掲載年度 2020
種類 国外
学会名 ICSPM28 - International Colloquium on Scanning Probe Microscopy
発表題目 Current Imaging of Mosaic-like Monolayer Films of Reduced Graphene Oxide
発表者 Kanishka De Silva
Pamarti Viswanath
Yuki Morikuni
Momo Matsuda
Tomiko Ikeda
Masamichi Yoshimura
主催団体
発表場所 Online
発表日 2020/12/10
講演内容 Conductive AFM (C-AFM) is a powerful nanoscale characterization tool for simultaneously obtaining the topography and the current distribution of a material. Employment of C-AFM in measuring electrical characteristics of multilayers of GO and RGO films and AFM tip induced electrochemical reduction of GO films have been reported [1,2]. However, these multilayer films show current flows in the range of 100 pA-100 nA at a high bias voltage (100 mV). Fabrication of highly conducting monolayer RGO films is in high demand for nano electronic devices. Here we report a high current (in A) flow in a thermally reduced monolayer film of GO, that at a bias voltage as small as 5 mV (see Fig. 1 for the C-AFM setup and the topographic and current images). The GO was functionalized with tetrabutylammoniumhydroxide (TBAOH) and spin-coated on SiO2 (50 nm)/Si substrates (1 cm2). A mosaic-like monolayer film is formed [3] and then annealed at 800 oC/30 min in Ar/H2 atmosphere [4]. This study offers not only a way of fabricating a continuous conducting RGO film but also its nanoscale electronic property measurement by C-AFM, which is suitable in the field of nano-electronic devices.