学会発表

表面科学
PD研究員 カニシカ デ シルバ

掲載年度 2020
種類 国内
学会名 59th Fullerenes Nanotubes Graphene General symposium
発表題目 Raman spectroscopy of graphene oxide and reduced graphene oxide flakes on Si-based substrates
発表者 Kanishka De Silva
Seiya Suzuki
Pamarti Viswanath
Masamichi Yoshimura
主催団体
発表場所 Online
発表日 2020/09/17
講演内容 The optical visibility of mono- and few-layer graphene oxide (GO) under optical microscope (OM) is challenging even by using 300 nm SiO2/Si substrate, which is the current standard for the visualization of pristine graphene. This is because of the large optical band-gap caused by higher degree of oxidation and intercalated water [1,2]. However, the optical contrast of GO can be improved by annealing GO on 300 nm SiO2/Si substrate. Apart from the optical visualization, the effect of the substrate on intrinsic properties of GO or reduced graphene oxide (RGO) should be taken into consideration. Raman spectroscopy is a versatile tool to characterize structural, electronic, and optical properties of graphene-based materials [3]. A strong dependence of the Raman spectroscopy of monolayer pristine graphene on the thickness of the SiO2 layer has been reported [4]. Yet, an in depth report on the effect of SiO2 thickness or the type of substrate on the Raman spectra of GO and RGO has not been reported. In this work, we show the influence of the substrate on Raman spectral properties (peak position, intensity, etc.) of GO and RGO mono- and few-layer flakes, which is useful in interpreting the Raman spectra of these materials.